研究業績
Electronics and Communications in Japan (Part II: Electronics) 86, 2, 84-93 (2003)
A DFT method for BIST of RTL data paths based on single-control testability
著者
Minoru Izutsu, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
カテゴリ
論文誌