Graduate School of Information Science and Engineering, Osaka University
Algorithm Engineering Group (Masuzawa Lab.)
日本語
|
English
Graduate School of Information Science and Engineering, Osaka University
Algorithm Engineering Group (Masuzawa Lab.)

Publication

  • Publication
  • A DFT method for BIST of RTL data paths based on single-control testability
Electronics and Communications in Japan (Part II: Electronics) 86, 2, 84-93 (2003)
A DFT method for BIST of RTL data paths based on single-control testability

Author

Minoru Izutsu, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara

Category

Journal