Publication

2003

Journal

• "A DFT method for BIST of RTL data paths based on single-control testability"
  Minoru Izutsu, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara
  Electronics and Communications in Japan (Part II: Electronics) 86, 2, 84-93 (2003).

  • DOI: 10.1002/ecjb.10122