Graduate School of Information Science and Engineering, Osaka University
Algorithm Engineering Group (Masuzawa Lab.)
日本語
|
English
Graduate School of Information Science and Engineering, Osaka University
Algorithm Engineering Group (Masuzawa Lab.)

Publication

  • Publication
  • A BIST method based on concurrent single-control testability of RTL data paths
Asian Test Symposium (ATS), 313-318 (2001)
A BIST method based on concurrent single-control testability of RTL data paths

Author

Kenichi Yamaguchi, Hiroki Wada, Toshimitsu Masuzawa, Hideo Fujiwara

Category

International Conference